Forensic Applications of the Scanning Electron Microscope

Forensic Applications of the Scanning Electron Microscope

the scanning electron microscope

it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...

The Scanning Confocal Electron Microscope

The Scanning Confocal Electron Microscope, is an instrument which permits the observation and characterization of sub-surface structures of thick, optically opaque materials at nanometer level resolutions. The instrument merges the capabilities of the scanning, transmission and x-ray microscopes, and achieves unprecedented resolutions in optically dense materials, by implementing the technology...

Smart Flexible Microrobots for Scanning Electron Microscope (SEM) Applications

In the scanning electron microscope (SEM), specially designed microrobots can act as a flexible assembly facility for hybrid microsystems, as probing devices for in-situ tests on IC structures or just as a helpful teleoperated tool for the SEM operator when examining samples. Several flexible microrobots of this kind have been developed and tested. Driven by piezoactuators, these few cubic cent...

Gaseous Scanning Electron Microscope (GSEM): Applications and Improvement

The imaging and the microanalysis of hydrated and insulating materials using electron beam probe methods (Conventional SEM, Auger Electron Microscopy,...) are very limited by the necessity to keep the sample under high vacuum and the presence of the charge effect. In this case the sample must be coated except when the experiment is performed at very low energy in order to avoid the charge pheno...